b) Plasma etching—Place microscope slide, with attached
collapsed filter pieces, in a low-temperature plasma asher. Be-
cause plasma ashers vary greatly in their performance, both from
unit to unit and between different positions in the asher barrel, it
is difficult to specify operating conditions. Insufficient etching
will result in a failure to expose embedded fibers; too much
etching may result in the loss of particles from the filter surface.
Calculate time for ashing on the basis of final sample observa-
tions in transmission electron microscope. Additional informa-
tion on calibration is available.
2,3
c) Carbon coating—Using high-vacuum carbon evaporator
(2570B.3p), proceed as follows: Place glass slide holding filters
on the rotation device and evacuate evaporator chamber to a
pressure of less than 0.013 Pa. Perform evaporation in very short
bursts, separated by 3 to4stoletelectrodes cool. An experi-
enced analyst can judge the thickness of the carbon film. Make
initial tests on unused filters. If the carbon film is too thin, large
particles will be lost from the TEM specimen, and there will be
few complete and undamaged grid openings. A coating that is
too thick will lead to a TEM image lacking in contrast and a
compromised ability to obtain electron diffraction patterns. The
carbon film should be as thin as possible and still remain intact
on most of the grid openings of the TEM specimen.
d) Specimen washing—Prepare a Jaffe washer according to
any published design.
1,4
One such washer consists of a simple
stainless steel bridge contained in a glass petri dish. Place on the
stainless steel bridge several pieces of lens tissue large enough to
hang completely over the bridge and into the solvent. In a fume
hood, fill petri dish with either acetone, DMF, 1-methyl-2-
pyrrolidone, or chloroform to the level of the stainless steel
bridge.
Place TEM grids, shiny side up, on a piece of lens tissue or
filter paper so that individual grids can be easily picked up with
forceps. Prepare from each sample three grids. Using a curved
scalpel blade, excise three square (3-mm ⫻3-mm) pieces of
carbon-coated MCE filter from random areas on the filter. Place
each square filter piece, carbon-side up, on top of a TEM
specimen grid (2570B.3r).
Place all three assemblies (filter/grid) for each sample on the
same piece of saturated lens tissue in Jaffe washer. Place lid on
the Jaffe washer and let system stand, preferably overnight.
Alternatively, place grids on a low-level (petri dish is filled
only enough to wet paper on screen bridge) DMF Jaffe washer
for 60 min. Then add enough solution of equal parts DMF/
acetone to fill washer up to screen level. Remove grids after 30
min if they have cleared, i.e., all filter material has been removed
from the carbon film, as determined by inspecting in the TEM.
Let grids dry before placing in TEM.
2) Polycarbonate (PC) filters—Cover surface of a clean mi-
croscope slide with two strips of double-sided cellophane tape.
Cut a strip of filter paper slightly narrower than width of slide.
Position filter paper strip on center of length of slide. Using a
clean, curved scalpel blade, cut a strip of the PC filter approxi-
mately 25 ⫻6 mm. Use a rocking motion of the scalpel blade to
avoid tearing filter. Place PC strip, particle side up, on slide
perpendicular to long axis of slide, making sure that the ends of
the PC strip contact the double-sided cellophane tape. Each slide
can hold several PC strips. Label filter paper next to each PC
strip with sample number.
Carbon-coat filter strips as directed in ¶ 1)c) above. (Etching
is not required.) Take special care to avoid overheating filter
sections during carbon coating.
Prepare a Jaffe washer as described in ¶ 1)d) above, but fill
washer with chloroform or 1-methyl-2-pyrrolidone to the level
of the screen. Using a clean curved scalpel blade, excise three
3-mm-square filter pieces from each PC strip. Place filter
squares, carbon side up, on shiny side of a TEM grid (2570B.3r).
Pick up grid and filter section together and place them on lens
tissue in the Jaffe washer. Place lid on Jaffe washer and leave
grids for at least 4 h. Best results are obtained with longer
wicking times, up to 12 h. Carefully remove grids from the Jaffe
washer and let dry in the grid box before placing them in a clean,
marked grid box.
d. Instrument calibration: Calibrate instrumentation regularly,
and keep a calibration record for each TEM in the laboratory, in
accordance with the laboratory’s quality assurance program.
Record all calibrations in a log book along with dates of cali-
bration and attached backup documentation.
Check TEM for both alignment and systems operation. Refer
to manufacturer’s operational manual for detailed instructions.
Calibrate camera length of TEM in electron diffraction (ED)
operating mode before observing ED patterns of unknown sam-
ples. Measure camera length by using a carbon-coated grid on
which a thin film of gold has been sputtered or evaporated. A
thin film of gold may be evaporated directly on to a specimen
grid containing asbestos fibers. This yields zone-axis ED patterns
from the asbestos fibers superimposed on a ring pattern from the
polycrystalline gold film. Optimize thickness of gold film so that
only one or two sharp rings are obtained. Thicker gold films may
mask weaker diffraction spots from the fibrous particles. Be-
cause unknown d-spacings of most interest in asbestos analysis
are those lying closest to the transmitted beam, multiple gold
rings from thicker films are unnecessary. Alternatively, use a
gold standard specimen to obtain an average camera constant
calculated for that particular instrument, which can then be used
for ED patterns of unknowns taken during the corresponding
period.
Calibrate magnification at the fluorescent screen at magnifi-
cation used for structure counting. Use a grating replica (e.g.,
one containing at least 2160 lines/mm). Define a field of view on
the fluorescent screen; the field must be measurable or previ-
ously inscribed with a scale or concentric circles (use metric
scales). Place grating replica at the same distance from the
objective lens as the specimen. For instruments that incorporate
a eucentric tilting specimen stage, place all specimens and the
grating replica at the eucentric position. Follow the instructions
provided with the grating replica to calculate magnification.
Frequency of calibration depends on service history of the mi-
croscope. Check calibration after any maintenance that involves
adjustment of the power supply to the lens, the high-voltage
system, or the mechanical disassembly of the electron optical
column (apart from filament exchange).
Check smallest spot size of the TEM. At the crossover point,
photograph spot size at a magnification of 25 000⫻(screen
magnification 20 000⫻). An exposure time of 1 s usually is
adequate. Measured spot size must be less than or equal to 250
nm.
Verify resolution and calibration of the EDXA as follows:
Collect a standard EDXA Cu and Al peak from a Cu grid coated
ASBESTOS (2570)/Transmission Electron Microscopy Method
4
ASBESTOS (2570)/Transmission Electron Microscopy Method